Force Volume Atomic Force Microscopy-Infrared for simultaneous nanoscale chemical and mechanical spectromicroscopy
Wagner, M., Hu, Q., Hu, S., Phillips, C., Wang, W., Pittenger, B., … & De Wolf, P. (2025). Force volume atomic force microscopy–infrared for simultaneous nanoscale chemical and mechanical spectromicroscopy. ACS nano, 19(19), 18791-18803.